Atomic force microscopy

JPK NanoWizard II | acquired 2011

Measurement modes

contact mode | intermittent contact | force modulation

Specifications

  • scan range 100 x 100 x 15 ┬Ám3
  • stage with 20 x 20 mm2 travel range
  • 5000 x 5000 pixels2 resolution for image scans

Sample environments

measurements in air |temperature control | liquid cell

Contact

I Gunkel | tel: 7398 | @ ilja.gunkel@unifr.ch

Rates